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Burn-In & Life Test

Life Testing

Life Testing is used to evaluate the long-term performance of products during the development cycle. Life testing is also used for production monitoring, usually through batch sampling or random product testing.Burn-in system with 36 trays

To provide meaningful results the test is usually carried out under maximum-rated operating conditions and may therefore take a long time (e.g. several months). Consequently many defective products could be shipped before a problem has been identified!

Higher stresses (beyond data sheet limits) may be used to accelerate the life test process. This allows problems to be identified more quickly while substantially reducing the capacity requirement for Life Test equipment. However, it is important to analyse the failures and carefully evaluate the results for relevance to actual failure mechanisms. This is because the higher stresses may introduce additional non-typical failure modes.

Burn-In Test Methods

Reliable foundations are an essential step towards a reliable product. Burn-In combines high junction temperatures with voltage stress to speed-up component failures due to chip contamination, IC bonding issues (purple plague) etc. and provides an established method of improving the reliability of electronic components prior to production.

By stressing your products with heat ( sometimes referred to soak testing), the DUT (device under test) can be statically or dynamically tested to eliminate early failures and remove them from the production batch. Static means the DUT is powered but not electrically exercised whereas dynamic burn-in means the device is also exercised during the test.

Sharetree offer a comprehensive range of Burn-In systems for components and sub-assemblies. Systems may be configured for low-cost Static, Dynamic, or Monitored Burn-In, including a built-in functionality test if required.